Thin films of a few layers of graphene obtained by
solid-state graphitization from 6H-SiC(0001) substrates have been studied by
X-ray photoelectron spectroscopy (XPS) and X-ray photoelectron diffraction
(XPD). The C1s core-level was resolved into components, which were associated
with carbon from bulk SiC, carbon from graphene and carbon at the
graphene/6H-SiC(0001)interface. Then, the intensity of each of these components
was recorded as a function of the polar (azimuth) angle for several azimuth
(polar) angles. These XPD measurements provide crystallographic information
which clearly indicates that the graphene sheets are organized in a graphite-like
structure on 6H-SiC(0001), an organisation that results from the shrinking of
the 6H-SiC(0001) lattice after Si depletion. Finally the decoupling of graphene
from the 6H-SiC(0001) substrate by oxygen intercalation was studied from the
XPS point of view.
Source: Surface Science
If you need more information about X-ray photoelectron spectroscopy (XPS) and diffraction
(XPD) study of a few layers of graphene on 6H-SiC(0001), please visit
our website:http://www.qualitymaterial.net, send us email at powerwaymaterial@gmail.com.
No comments:
Post a Comment