TEM characterization of Si films grown on 6H–SiC (0001) C-face

Si films with〈111〉preferred orientation have been prepared on 6H–SiC (0001) C-face by low-pressure chemical vapor deposition. The high-resolution transmission electron microscopy and the selected area electron diffraction results indicate that the Si film has epitaxial connection with the 6H–SiC substrate and the parallel-plane relationship of Si/6H–SiC heterojunction is (111)Si//(0001)6H–SiC. Misfit dislocation array is clearly observed at the Si/6H–SiC interface, which accommodates the most of lattice mismatch strain and make the lattice coincident at the Si/6H–SiC interface.

Highlights

► Si/SiC heterojunction was employed to realize non-UV light operation of SiC devices.

► Si films of preferred orientation have been prepared on 6H–SiC (0001) C-face successfully. 
► HRTEM results indicate that Si film has epitaxial connection with the 6H–SiC substrate.

► The lattice-matching mode of the Si/SiC interface is defined by HRTEM.

Source: Materials Letters

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